Calibration Standards
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| Nickel star pattern for Photoelectron Emission Microscopy (PEEM) calibration SEM image on left and corresponding PEEM image on right. | |
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| PMMA AFM and STM calibration standards: square array with 100 nm size and 200 nm pitch (A), square array with 50 nm size and 100 nm pitch (B), bar=100 nm, AFM image of the same sample (C). | |